Advances in Imaging and Electron Physics

by Peter W. Hawkes (Editor)

Overview

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Product Details

ISBN-13:	9780080569123
Publisher:	Elsevier Science
Publication date:	09/06/2011
Series:	Advances in Imaging and Electron Physics , #150
Sold by:	Barnes & Noble
Format:	eBook
Pages:	288
File size:	14 MB
Note:	This product may take a few minutes to download.

About the Author

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

Table of Contents

Contributors     vii
Preface     ix
Future Contributions     xi
Reconstruction Algorithms for Computed Tomography   Claas Bontus   Thomas Kohler
Introduction     2
Principles of Computed Tomography     4
CT Reconstruction     15
Outlook     59
References     61
Color Spaces and Image Segmentation   Laurent Busin   Nicolas Vandenbroucke   Ludovic Macaire
Introduction     66
Color Spaces     66
Color Image Segmentation     110
Relationships between Segmentation and Color Spaces     140
Conclusion     161
References     162
Generalized Discrete Radon Transforms and Applications to Image Processing   Glenn R. Easley   Flavia Colonna
Introduction     170
Background on Wavelets     179
Beyond Wavelets     190
The Discrete p-Adic Radon Transform     197
Generalized Discrete Radon Transform     204
Noise Removal Experiments     217
Applications to Image Recognition     221
Recognition Experiments     230
Conclusion     231
References     235
Lie Algebraic Methods in Charged Particle Optics   Tomas Radlicka
Introduction     242
Trajectory Equations     245
The Field Computation     251
Trajectory Equations: Solution Methods     257
The Analytic Perturbation Method     273
The Symplectic Classification of Geometric Aberrations     310
Axial Symmetric Aberrations of the Fifth Order     338
References     360
Recent Developments in Electron Backscatter Diffraction   Valerie Randle
Introduction     363
Fundamental Aspects of EBSD     364
The Orientation Map and Data Processing     374
Established Applications of EBSD     380
Recent Advances in EBSD     382
Advances in EBSD Technology     388
Trends in EBSD Usage     410
References     411
Index     417

Editorial Reviews

The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.

Booknews

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. The Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
—J.A. Chapman in LABORATORY PRACTICE

From the Publisher