Fourier-Transform Spectroscopy Instrumentation Engineering

Fourier-Transform Spectroscopy Instrumentation Engineering

ISBN-10:
0819451649
ISBN-13:
9780819451644
Pub. Date:
11/28/2003
Publisher:
SPIE Press
ISBN-10:
0819451649
ISBN-13:
9780819451644
Pub. Date:
11/28/2003
Publisher:
SPIE Press
Fourier-Transform Spectroscopy Instrumentation Engineering

Fourier-Transform Spectroscopy Instrumentation Engineering

Paperback

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Overview

Intended for engineers and scientists who need to make hardware, software, or procedural modifications, this book explains the design and instrumentation of Michelson-interferometer-based Fourier transform spectrometers. The author defines the signal-to-noise ratio and the principles of interferometer operation, then describes the FT spectrometer's motion components, analog-to-digital conversion process, detection system, and optical components. Annotation ©2004 Book News, Inc., Portland, OR

Product Details

ISBN-13: 9780819451644
Publisher: SPIE Press
Publication date: 11/28/2003
Series: SPIE Press Monograph Series
Pages: 136
Product dimensions: 6.90(w) x 9.90(h) x 0.50(d)

Table of Contents

Prefacexi
Chapter 1Spectroscopy Instrumentation1
1.1Introduction1
1.2Types of Spectrometers1
1.2.1Dispersive spectrometers1
1.2.2Filter-based spectrometers2
1.2.3Fourier-transform spectrometers3
1.3Advantages of FT Spectrometers4
1.3.1Throughput or Jacquinot advantage4
1.3.2Multiplex or Felgett advantage6
1.4Discussions on FT Spectrometer Advantages8
References9
Chapter 2Signal-to-Noise Ratio11
2.1Signal-to-Noise Ratio Defined11
2.2Quantifying Signal-to-Noise Ratio12
2.3Practical Considerations15
Chapter 3Principles of Interferometer Operation17
3.1Overview17
3.2Quantitative Explanation19
3.2.1Light as a wave19
3.2.2Measurable light quantity21
3.2.3Interference and superposition22
3.2.4Polychromatic source24
3.2.5Fourier-transform routine25
3.3Theoretical Resolution26
3.3.1Retardation distance26
3.3.2Divergence angle29
3.4Interferogram Digital Processing32
3.4.1Apodization32
3.4.2Zero filling34
3.4.3Phase correction34
References34
Chapter 4Interferometer Alignment Errors37
4.1Error Characteristics39
4.2Interferogram-Modulation Error40
4.3Interferogram-Sampling Error45
References46
Chapter 5Motion Components and Systems47
5.1Actuators48
5.1.1Actuator types48
5.1.2Performance specifications for actuators48
5.2Driver and Amplifier50
5.3Bearings and Coupling Mechanism50
5.3.1Bearing types51
5.3.2Performance specifications for bearings51
5.3.3Discussion on bearings53
5.4Position Sensor55
5.4.1Laser interferometer56
5.4.2Sensor specifications58
5.5Homodyne Interferometer Sources of Error59
5.5.1Source wavelength variations59
5.5.2Refractive index variations59
5.5.3Laser detector errors60
5.5.4Polarization errors60
5.5.5Alignment errors61
5.6Actuator, Sensor, and Mirror Mounting61
5.6.1Actuator location vs. center of mass61
5.6.2Sensor location vs. mirror location62
5.6.3Sensor location vs. actuator location62
5.7Digital Motion Controller63
References64
Chapter 6Interferogram Data Sampling65
6.1Step Scan vs. Continuous Scan66
6.2Sampling Period67
6.2.1The absolute minimum: the Nyquist criteria67
6.2.2More than the Nyquist minimum68
6.2.3Anti-alias filter69
6.3Accuracy with Respect to OPD71
6.3.1Effects of sampling errors to the output spectrum71
6.3.2Sources of sampling error73
6.4Repeatable Clock Position74
6.5Hardware Considerations74
References76
Chapter 7Data Acquisition77
7.1DAQ Hardware Formats77
7.2Analog Inputs77
7.2.1Number of channels78
7.2.2Sampling rate78
7.2.3Resolution78
7.2.4Input ranges78
7.2.5Accuracy79
7.3Hardware Triggering and Clock Signal79
7.4Effects of ADC Resolution on Spectral SNR80
Chapter 8The Detector83
8.1Noise-Equivalent-Power83
8.2Spectral SNR quantification84
8.3Detector Types87
8.4Selection Guidelines88
8.4.1Spectral range and responsivity88
8.4.2Active area88
8.4.3Noise and detectivity89
8.4.4Linearity89
8.4.5Temporal bandwidth90
8.4.6Summary90
References91
Chapter 9Consideration of Optics and Interferometer Alignment93
9.1System Throughput93
9.2Lenses vs. Mirrors95
9.3Interferometer Alignment Procedure96
Chapter 10Signal-to-Noise Ratio Enhancement Techniques99
10.1Identification of Error Sources99
10.1.1Detector noise99
10.1.2Digitization noise100
10.1.3Interferometer alignment error101
10.1.4Sampling error101
10.1.5Light-source variation101
10.2Averaging102
10.3Temporal Modulation and Bandwidth Narrowing103
10.4Spectral-Bandwidth Narrowing104
10.5Spectral Post-Processing105
10.6Double Beaming106
10.6.1Electrical subtraction107
10.6.2Optical subtraction107
10.7Gain ranging109
10.8Dynamic Tilt Compensation109
References110
Appendix ASimulation of Static-Tilt Error111
Appendix BSampling Circuit Example113
Appendix CSimulation of Sampling Error115
Index117
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