Introduction to Scanning Tunneling Microscopy

by C. Julian Chen

Overview

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field.

The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advances in this direction are presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.

Product Details

ISBN-13:	9780195071504
Publisher:	Oxford University Press, USA
Publication date:	05/20/1993
Series:	Oxford Series on Optical and Imaging Sciences Series , #4
Pages:	472
Product dimensions:	6.25(w) x 9.50(h) x 1.20(d)

About the Author

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.

Please visit the author's homepage for more information. [add URL as in the HB webpage: http://www.columbia.edu/~jcc2161/]

Table of Contents

1. Overview
Part I
PRINCIPLES
2. Tunneling Phenomena
3. Tunneling Matrix Elements
4. Atomic forces
5. Atomic Forces and Tunneling
6. Nanometer-Scale Imaging
7. Atomic-Scale Imaging
8. Nanomechanical Effects
Part II
INSTRUMENTATION
9. Piezoelectric Scanners
10. Vibration Isolation
11. Electronics and Control
12. Mechanical Design
13. Tip Treatment
14. Scanning Tunneling Spectroscopy
15. The Atomic Force Microscope
16. Illustrative Applications
APPENDICES
A. Green's Functions
B. Spherical Modified Bessel Functions
C. Surface symmetry
D. Elementary elasticity theory

Editorial Reviews

"The book Introduction to Scanning Tunneling Microscopy by C. Julian Chen serves as an excellent starting point to familiarize newcomers with the field, and at the same time provides an in-depth account of theoretical and practical aspects of SPM for the more experienced user. In my personal experience it is also very useful as a textbook for teaching single-molecule studies, at both the beginnersâ and the advanced level." — Journal of Applied Crystallography

From the Publisher