Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces / Edition 2

by Dror Sarid

Overview

This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.

Product Details

ISBN-13:	9780195092042
Publisher:	Oxford University Press, USA
Publication date:	07/28/1994
Series:	Oxford Series on Optical and Imaging Sciences Series , #5
Edition description:	Rev. ed
Pages:	288
Product dimensions:	6.38(w) x 9.50(h) x 0.91(d)

Table of Contents

PART ONE: LEVERS AND NOISE
1. Mechanical Properties of Levers
2. Resonance Enhancement
3. Sources of Noises
PART TWO: SCANNING FORCE MICROSCOPES
4. Tunneling Detection Systems
5. Capacitance Detection Systems
6. Homodyne Detection Systems
7. Heterodyne Detection Systems
8. Laser-Diode Feedback Detection Systems
9. Polarization Detection Systems
10. Deflection Detection Systems
PART THREE: SCANNING FORCE MICROSCOPY
11. Electric Force Microscopy
12. Magnetic Force Microscopy
13. Atomic Force Microscopy

Editorial Reviews

From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." —Journal of Colloid and Interface Science

"A valuable contribution to the literature, providing a sound theoretical basis." —Journal of Solid State Chemistry

"A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." —Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique

"One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."—Microscope

"Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."—Materials Research Bulletin

From the Publisher

Summarizes the current state of scanning tunneling microscopy, invented in 1982, and now widely used in the atomic-level analysis of surface structures. Reviews the basic theory and explains such variations as inverse photoemission, conductance, force, thermal, and near-field optical. For industrial or academic researchers using, or thinking of using, the technique. Annotation c. Book News, Inc., Portland, OR (booknews.com)

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