Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis: Basics of Imaging and Analysis
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:
1127294024
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- Introduction (N Tanaka)
- Historical Survey of the Development of STEM Instruments (N Tanaka)
- Basic Knowledge of STEM:
- Basics of STEM (N Tanaka and K Saitoh)
- Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
- Theories of STEM Imaging:
- Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
- Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
- Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
- Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
- Advanced Methods in STEM:
- Aberration Correction in STEM (H Sawada)
- Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
- Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
- Electron Tomography in STEM (N Tanaka)
- Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
- Recent Topics and Future Prospects in STEM (N Tanaka)
- Most advanced; befitting beginning graduate students
- Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
- Spans from the basic theory to the applications of STEM
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis: Basics of Imaging and Analysis
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:
-
- Introduction (N Tanaka)
- Historical Survey of the Development of STEM Instruments (N Tanaka)
- Basic Knowledge of STEM:
- Basics of STEM (N Tanaka and K Saitoh)
- Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
- Theories of STEM Imaging:
- Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
- Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
- Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
- Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
- Advanced Methods in STEM:
- Aberration Correction in STEM (H Sawada)
- Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
- Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
- Electron Tomography in STEM (N Tanaka)
- Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
- Recent Topics and Future Prospects in STEM (N Tanaka)
- Most advanced; befitting beginning graduate students
- Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
- Spans from the basic theory to the applications of STEM
62.0
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Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis: Basics of Imaging and Analysis
616
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis: Basics of Imaging and Analysis
616
62.0
In Stock
Product Details
| ISBN-13: | 9781783264711 |
|---|---|
| Publisher: | Imperial College Press |
| Publication date: | 08/21/2014 |
| Sold by: | Barnes & Noble |
| Format: | eBook |
| Pages: | 616 |
| File size: | 30 MB |
| Note: | This product may take a few minutes to download. |
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