0
    Advances in Imaging and Electron Physics

    Advances in Imaging and Electron Physics

    by Peter W. Hawkes (Editor)


    eBook

    $260.00
    $260.00

    Customer Reviews

    Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.

    In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.

    In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.

    He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.

    Read More

    Table of Contents


    Contributors     vii
    Preface     ix
    Future Contributions     xi
    Reconstruction Algorithms for Computed Tomography   Claas Bontus   Thomas Kohler
    Introduction     2
    Principles of Computed Tomography     4
    CT Reconstruction     15
    Outlook     59
    References     61
    Color Spaces and Image Segmentation   Laurent Busin   Nicolas Vandenbroucke   Ludovic Macaire
    Introduction     66
    Color Spaces     66
    Color Image Segmentation     110
    Relationships between Segmentation and Color Spaces     140
    Conclusion     161
    References     162
    Generalized Discrete Radon Transforms and Applications to Image Processing   Glenn R. Easley   Flavia Colonna
    Introduction     170
    Background on Wavelets     179
    Beyond Wavelets     190
    The Discrete p-Adic Radon Transform     197
    Generalized Discrete Radon Transform     204
    Noise Removal Experiments     217
    Applications to Image Recognition     221
    Recognition Experiments     230
    Conclusion     231
    References     235
    Lie Algebraic Methods in Charged Particle Optics   Tomas Radlicka
    Introduction     242
    Trajectory Equations     245
    The Field Computation     251
    Trajectory Equations: Solution Methods     257
    The Analytic Perturbation Method     273
    The Symplectic Classification of Geometric Aberrations     310
    Axial Symmetric Aberrations of the Fifth Order     338
    References     360
    Recent Developments in Electron Backscatter Diffraction   Valerie Randle
    Introduction     363
    Fundamental Aspects of EBSD     364
    The Orientation Map and Data Processing     374
    Established Applications of EBSD     380
    Recent Advances in EBSD     382
    Advances in EBSD Technology     388
    Trends in EBSD Usage     410
    References     411
    Index     417

    Available on NOOK devices and apps

    • NOOK eReaders
    • NOOK GlowLight 4 Plus
    • NOOK GlowLight 4e
    • NOOK GlowLight 4
    • NOOK GlowLight Plus 7.8"
    • NOOK GlowLight 3
    • NOOK GlowLight Plus 6"
    • NOOK Tablets
    • NOOK 9" Lenovo Tablet (Arctic Grey and Frost Blue)
    • NOOK 10" HD Lenovo Tablet
    • NOOK Tablet 7" & 10.1"
    • NOOK by Samsung Galaxy Tab 7.0 [Tab A and Tab 4]
    • NOOK by Samsung [Tab 4 10.1, S2 & E]
    • Free NOOK Reading Apps
    • NOOK for iOS
    • NOOK for Android

    Want a NOOK? Explore Now

    Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

    Recently Viewed 

    Booknews
    The four surveys contained in this volume illustrate widely diverse aspects of imaging and electron physics. The first two chapters address applications of electron microscopy, including the role of this technique in mineralogy and a study of the high- resolution electron microscopy of quasicrystals. The latter is actually a short monograph presenting the underlying crystallography and explaining in detail how the corresponding images and diffraction patterns should be interpreted. The third contribution is an account of a new approach to deconvolution in image processing in which the author, by associating a polynomial with the gray-level values of (discrete) images, shows that it is possible to invert the convolutional relation that describes many kinds of image formation. The volume ends with a detailed discussion of the dual de Broglie wave, including a critical account of new developments in the debate over the existence and role of such a wave. Annotation c. by Book News, Inc., Portland, Or.
    From the Publisher
    "With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. The Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
    —J.A. Chapman in LABORATORY PRACTICE
    Sign In Create an Account
    Search Engine Error - Endeca File Not Found