Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents / Edition 1

by Adam Foster, Werner A. Hofer

Overview

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Product Details

ISBN-13:	9780387400907
Publisher:	Springer New York
Publication date:	06/28/2006
Series:	NanoScience and Technology Series , #5700
Edition description:	2006
Pages:	282
Product dimensions:	6.10(w) x 9.25(h) x 0.03(d)

Table of Contents

The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.